Semiconductor device

ABSTRACT

A semiconductor device includes a first lead having a base extending in a first direction, and an IC on the base. The semiconductor device also includes a second lead, a third lead and fourth leads. The second lead includes a first belt-like section on one side of the base in the first direction, extending in a second direction, and paired second belt-like sections extending in the first direction from the first belt-like section. The third lead is on one side in the first direction. The fourth leads are on one side of the third lead in the first direction. First switching elements are bonded to the third lead. Second switching elements are respectively bonded to the fourth leads. The base overlaps with the first belt-like section  121  when viewed in the first direction. At least a part of the base is between the second belt-like sections.

TECHNICAL FIELD

The present disclosure relates to a semiconductor device to be used tocontrol, for example, an electric motor.

BACKGROUND ART

A semiconductor device for controlling the operation of a motorincludes, for example, a plurality of switching elements (e.g., MOSFET),and an IC for driving the switching elements. Patent Document 1discloses an example of such a semiconductor device (see FIG. 11). Thedisclosed semiconductor device is applicable to control of the operationof a brushless DC motor.

The semiconductor device of Document 1 includes six switching elementsfor converting DC power to three-phase AC power. The switching elementsare aligned in one direction (x-direction in FIG. 11), and therefore thesemiconductor device has to be formed in an elongate shape extending inthat direction. This issue nay need to be addressed, from the viewpointof reduction in the device size.

PRIOR ART DOCUMENT Patent Document

-   Patent Document 1: JP-A-2017-34079

SUMMARY OF INVENTION Problem to be Solved by the Invention

In view of the foregoing situation, an object of the present disclosureis to provide a semiconductor device that can be produced with a reducedsize.

Means for Solving the Problem

In an aspect, the present disclosure provides a semiconductor deviceincluding a first lead having a mounting base elongate in a firstdirection, an IC configured to be mounted on the mounting base, a secondlead including a first belt-like section spaced apart from the mountingbase in the first direction, and a pair of second belt-like sectionsconnected to the first belt-like section, the first belt-like sectionbeing elongate in a second direction orthogonal to both of the firstdirection and a thickness direction of the mounting base, a third leadconfigured to space apart from the first lead, with the second leadinterposed therebetween, a plurality of first switching elementsconfigured to electrically connect to the third lead, and configured toelectrically connect to the IC, a plurality of fourth leads configuredto space apart from the second lead, with the third lead interposedtherebetween, and configured to electrically connect respectively to theplurality of first switching elements, a plurality of second switchingelements configured to electrically connect respectively to theplurality of fourth leads, and each configured to electrically connectto both of the IC and the second lead, and a sealing resin arranged tocover a part of each of the plurality of fourth leads, the first lead,the second lead, and the third lead, and to cover the IC, the pluralityof first switching elements, and the plurality of second switchingelements. Further, the mounting base overlaps with the first belt-likesection, when viewed in the first direction, and at least a part of themounting base is located between the pair of second belt-like sections.

Preferably, the first lead may include a first terminal section, a firstjoint section, and a first suspension section, the first terminalsection may protrude from the sealing resin in the first direction, whenviewed in the thickness direction, the first joint section may beconnected to the mounting base and the first terminal section, and thefirst suspension section may be located on an opposite side of the firstjoint section in the second direction, with respect to the mountingbase, and may extend from the mounting base in the second direction.

Preferably, the first joint section and the first suspension section maybe located on a farther side from the first belt-like section of thesecond lead, with respect to the pair of second belt-like sections.

Preferably, the first joint section may include a region inclined withrespect to both of the first direction and the second direction.

Preferably, the second lead may include a second terminal sectionprotruding from the sealing resin in the first direction, when viewed inthe thickness direction, a second joint section connected to one of thepair of second belt-like sections and the second terminal section, and asecond suspension section extending from the other of the pair of secondbelt-like sections, in the second direction.

Preferably, the second joint section may be located adjacent to thefirst joint section in the second direction, and the second suspensionsection may be located adjacent to the first suspension section in thefirst direction.

Preferably, the second terminal section may be located adjacent to thefirst terminal section in the second direction.

Preferably, the second joint section may include a region inclined withrespect to both of the first direction and the second direction.

Preferably, the third lead may include a plurality of first pad sectionsto which the plurality of first switching elements are electricallyconnected respectively, a third terminal section protruding from thesealing resin in the first direction, when viewed in the thicknessdirection, and a third joint section connected to the plurality of firstpad sections and the third terminal section.

Preferably, the plurality of first pad sections may include a firstregion located adjacent to the second suspension section in the firstdirection, a second region located adjacent to the first belt-likesection in the first direction, and a third region located adjacent tothe second joint section in the first direction. The third joint sectionmay include an outer joint section connected to the first region and thethird terminal section, a first inner joint section connected to thefirst region and the second region, and a second inner joint sectionconnected to the second region and the third region. The first belt-likesection may overlap with the second region, the first inner jointsection, and the second inner joint section, when viewed in the firstdirection, and a part of each of the pair of second belt-like sectionsmay be located between the first inner joint section and the secondinner joint section.

Preferably, the third lead may include a third suspension sectionextending from the third region in the second direction.

Preferably, a part of the second region may protrude from both of thefirst inner joint section and the second inner joint section, in thefirst direction.

Preferably, the first inner joint section and the second inner jointsection may each include a belt-like region extending from the secondregion in the second direction, and the belt-like region of the firstinner joint section may be shorter than the belt-like region of thesecond inner joint section.

Preferably, the plurality of fourth leads may each include a second padsection to which one of the plurality of second switching elements iselectrically connected, and a fourth terminal section connected to thesecond pad section and protruding from the sealing resin in the firstdirection, when viewed in the thickness direction, and the plurality offourth terminal sections may be aligned in the second direction, inalignment with the third terminal section.

Preferably, a part of one of the plurality of second pad sections mayoverlap with the first region, and be located between the outer jointsection and the first inner joint section, when viewed in the firstdirection.

Preferably, the sealing resin may include a pair of side faces spacedapart from each other in the second direction, the first suspensionsection and the second suspension section each having an end faceexposed from one of the pair of side faces, and the third suspensionsection having an end face exposed from the other of the pair of sidefaces.

Preferably, the IC may have a belt-like shape elongate in the firstdirection, when viewed in the thickness direction.

Advantageous Effects of Invention

With the foregoing configuration according to the present disclosure,the semiconductor device can be formed in a reduced size.

Other features and advantages of the present disclosure will become moreapparent, through the detailed description given hereunder withreference to the accompanying drawings.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a perspective view showing a semiconductor device according toa first embodiment.

FIG. 2 is a plan view of the semiconductor device shown in FIG. 1.

FIG. 3 is a plan view of the semiconductor device shown in FIG. 1, seenthrough a sealing resin.

FIG. 4 is an enlarged plan view showing a part of FIG. 3.

FIG. 5 is a front view of the semiconductor device shown in FIG. 1.

FIG. 6 is a rear view of the semiconductor device shown in FIG. 1.

FIG. 7 is a right-side view of the semiconductor device shown in FIG. 1.

FIG. 8 is a left-side view of the semiconductor device shown in FIG. 1.

FIG. 9 is a cross-sectional view taken along a line IX-IX in FIG. 3.

FIG. 10 is a cross-sectional view taken along a line X-X in FIG. 3.

FIG. 11 is a cross-sectional view taken along a line XI-XI in FIG. 3.

FIG. 12 is a cross-sectional view taken along a line XII-XII in FIG. 3.

FIG. 13 is a cross-sectional view taken along a line XIII-XIII in FIG.3.

FIG. 14 is a partial cross-sectional view taken along a line XIV-XIV inFIG. 3.

FIG. 15 is a partial cross-sectional view taken along a line XV-XV inFIG. 3.

FIG. 16 is a functional block diagram of the semiconductor device shownin FIG. 1.

FIG. 17 is a plan view of a semiconductor device according to a secondembodiment, seen through a sealing resin.

FIG. 18 is a front view of the semiconductor device shown in FIG. 17.

FIG. 19 is a rear view of the semiconductor device shown in FIG. 17.

FIG. 20 is a cross-sectional view taken along a line XX-XX in FIG. 17.

FIG. 21 is a cross-sectional view taken along a line XXI-XXI in FIG. 17.

FIG. 22 is a cross-sectional view taken along a line XXII-XXII in FIG.17.

FIG. 23 is a circuit diagram for explaining the semiconductor deviceshown in FIG. 17.

MODE FOR CARRYING OUT THE INVENTION

Hereafter, preferred embodiments of the present disclosure will bedescribed, with reference to the drawings.

Referring to FIG. 1 to FIG. 15, a semiconductor device A10 according toa first embodiment will be described. The semiconductor device A10includes a first lead 11, a second lead 12, a third lead 13, a pluralityof fourth leads 14, a plurality of boot leads 15, a plurality of controlleads 16, an integrated circuit or IC 20, a plurality of first switchingelements 31, a plurality of second switching elements 32, and a sealingresin 50. The semiconductor device A10 also includes a plurality offirst wires 41, a plurality of second wires 42, a plurality of firstgate wires 431, a plurality of second gate wires 432, a plurality offirst potential wires 441, a second potential wire 442, a plurality ofboot wires 45, a ground wire 46, and a plurality of control wires 47. InFIG. 3, the mentioned elements are seen through the sealing resin 50,for the sake of clarity (see dash-dot-dot lines). FIG. 9 to FIG. 15 arecross-sectional views taken along dash-dot lines (IX-IX, X-X, and soforth) in FIG. 3.

In the description of the semiconductor device A10, three directions x,y, and z which are orthogonal to each other, marked in FIGS. 1 to 15,will be referred to as appropriate. In the present disclosure, thedirection z will also be referred to as “thickness direction”, which isorthogonal to, for example, a mounting base (to be subsequentlydescribed) of the first lead 11. The direction x and the direction y areorthogonal to the direction z, and will be referred to as “firstdirection” and “second direction”, respectively. In subsequent passages,a semiconductor device A20 will also be described with reference to thethree directions x, y, and z.

The semiconductor device A10 is configured to convert DC power tothree-phase AC power, using the plurality of first switching elements 31and the plurality of second switching elements 32. The semiconductordevice A10 is applicable, for example, to control of the operation of abrushless DC motor.

The first lead 11, the second lead 12, the third lead 13, the pluralityof fourth leads 14, the plurality of boot leads 15, and the plurality ofcontrol leads 16 are conductive materials constituted of the same leadframe. These conductive materials constitute a part of the conductionpath between the functional elements (IC 20, plurality of firstswitching elements 31, and plurality of second switching elements 32),and a circuit board on which the semiconductor device A10 is mounted.The lead frame may be formed of copper (Cu) or a copper-based alloy.

The first lead 11 includes, as shown in FIG. 3, a mounting base 111, afirst terminal section 112, a first joint section 113, and a firstsuspension section 114.

As shown in FIG. 3, the mounting base 111 extends in the first directionx. The mounting base 111 has a rectangular shape having the long sidesextending in the first direction x, when viewed in the thicknessdirection z. As shown in FIG. 9 and FIG. 10, the mounting base 111includes a main face 111A oriented in the thickness direction z. In theillustrated example, the main face 111A is orthogonal to the thicknessdirection z. The main face 111A may be covered, for example, with asilver (Ag)-plated layer.

As shown in FIG. 2 and FIG. 3, the first terminal section 112 protrudesfrom the sealing resin 50 in the first direction x (to the left in thedrawings), when viewed in the thickness direction z. The first terminalsection 112 is, for example, bent at two positions, when viewed in thesecond direction y (similar to a second terminal section 123 of thesecond lead 12 shown in FIG. 5). The first terminal section 112 may becovered, for example, with a tin (Sn)-plated layer, or a tin-silveralloy-plated layer.

As shown in FIG. 3, the first joint section 113 is connected to themounting base 111 and the first terminal section 112. The first jointsection 113 includes a region 113A inclined with respect to both of thefirst direction x and the second direction y. A surface of the firstjoint section 113 (oriented to the same side as is the main face 111A)may be covered, for example, with a silver-plated layer.

As shown in FIG. 3, the first suspension section 114 is located on theopposite side of the first joint section 113 in the second direction y,with respect to the mounting base 111. The first suspension section 114extends in the second direction y. The mounting base 111 is interposedbetween the first joint section 113 and the first suspension section114, in the second direction y. An end face 114A of the first suspensionsection 114 oriented in the second direction y is exposed from thesealing resin 50 (see FIG. 6). As shown in FIG. 3, the first suspensionsection 114 and the first joint section 113 are configured to spaceapart from the pair of second belt-like sections 122A and 122B (to besubsequently described) of the second lead 12 to the left, in otherwords in the direction away from the first belt-like section 121 of thesecond lead 12.

The second lead 12 is formed so as to extend along an outer edge of thefirst lead 11, with a spacing therefrom, as shown in FIG. 3. In theillustrated example, the second lead 12 is located generally on theright of the first lead 11. As shown in FIG. 3 and FIG. 4, the secondlead 12 includes a first belt-like section 121, a pair of secondbelt-like sections 122A and 122B, the second terminal section 123, asecond joint section 124, a second suspension section 125, and a secondauxiliary suspension section 126.

As shown in FIG. 4, the first belt-like section 121 is located on theright of the mounting base 111. The first belt-like section 121 extendsin the second direction y. As shown in FIG. 10, the mounting base 111overlaps with the first belt-like section 121, when viewed in the firstdirection x. Accordingly, the mounting base 111 and the first belt-likesection 121 are at the same level in height, for example with respect tothe bottom face of the sealing resin 50.

As shown in FIG. 4, the pair of second belt-like sections 122A and 122Bextend to the left, from the respective ends 121A (configured to spaceapart from each other in the second direction y) of the first belt-likesection 121. When viewed in the thickness direction z, the firstbelt-like section 121 and the pair of second belt-like sections 122A and122B are orthogonal to each other. At least a part of the mounting base111 is located between the pair of second belt-like sections 122A and122B. The respective surfaces of the first belt-like section 121 and thepair of second belt-like sections 122A and 122B (surfaces seen in FIG.4) may be covered, for example, with a silver-plated layer.

As shown in FIG. 2 and FIG. 3, the second terminal section 123 protrudesto the left from the sealing resin 50, when viewed in the thicknessdirection z. As shown in FIG. 5, the second terminal section 123 isbent, when viewed in the second direction y. More specifically, thesecond terminal section 123 is bent at a first point, distant from theside face of the sealing resin 50 by a predetermined distance, andextends obliquely downward. The second terminal section 123 is againbent at a second point, and then extends generally horizontally(direction x). The second terminal section 123 is located adjacent tothe first terminal section 112, in the second direction y. The secondterminal section 123 may be covered, for example, with a tin-platedlayer, or a tin-silver alloy-plated layer.

As shown in FIG. 3, the second joint section 124 is connected to thesecond belt-like section 122A and the second terminal section 123. Thesecond joint section 124 is located on the left of the pair of secondbelt-like sections 122A and 122B, in the first direction x. In thesecond direction y, the second joint section 124 is located adjacent tothe first joint section 113. The second joint section 124 includes aregion 124A, inclined with respect to both of the first direction x andthe second direction y. The surface of the second joint section 124(surface seen in FIG. 3) may be covered, for example, with asilver-plated layer.

As shown in FIG. 3, the second suspension section 125 extends from thesecond belt-like section 122B, in the second direction y. At least apart of the second suspension section 125 is located on the left of thepair of second belt-like sections 122A and 122B, in the first directionx. In addition, the second suspension section 125 is located adjacent tothe first suspension section 114, in the first direction x. An end face125A of the second suspension section 125 oriented in the seconddirection y is exposed from the sealing resin 50 (see FIG. 6).

As shown in FIG. 3, the second joint section 124 includes a portionextending in the first direction x, and a second auxiliary suspensionsection 126 extends from such portion, in the second direction y. An endface 126A of the second auxiliary suspension section 126 oriented in thesecond direction y is exposed from the sealing resin 50 (see FIG. 5).

The third lead 13 is located on the right of the second lead 12, asshown in FIG. 3. The third lead 13 includes a plurality of first padsections 130, a third terminal section 132, a third joint section 133, athird suspension section 134, and a third auxiliary suspension section135. In the example shown in FIG. 3, three first pad sections 130 areprovided.

As shown in FIG. 3, a plurality of first switching elements 31 areelectrically connected respectively to the plurality of first padsections 130. As shown in FIG. 9, FIG. 10, and FIG. 14, the plurality offirst pad sections 130 each include a main face 130A oriented upward(direction in which the main face 111A of the mounting base 111 isoriented, in the thickness direction z). The main face 130A may becovered, for example, with a silver-plated layer. The plurality of firstpad sections 130 include a plurality of regions. In the example shown inFIG. 3, the plurality of first pad sections 130 include a first region131A, a second region 131B, and a third region 131C, respectively.

As shown in FIG. 3, the first region 131A is located close to the secondsuspension section 125. At least a part of the first region 131A islocated adjacent to the second suspension section 125, in the firstdirection x. In the second direction y, the first region 131A is locatedadjacent to the second belt-like section 122B. As shown in FIG. 3 andFIG. 10, the first region 131A includes a pair of holes 130B penetratingtherethrough in the thickness direction z. The pair of holes 130B areconfigured to space apart from each other in the second direction y,across the first switching element 31. As shown in FIG. 3 and FIG. 14,the first region 131A includes a plurality of grooves 130C, recessedfrom the main face 130A. The plurality of grooves 130C are located alongthe periphery of the first switching element 31, with a spacing fromeach other. The plurality of grooves 130C may be formed, for example,through a V-notch process. The plurality of grooves 130C serve to blockthe solder for bonding the first switching element 31 to the firstregion 131A, like other grooves to be subsequently described.

As shown in FIG. 3 and FIG. 4, the second region 131B is locatedadjacent to the first belt-like section 121 of the second lead 12, inthe first direction x. The second region 131B includes a groove 130C.The grooves 130C is located on the right of the first switching element31.

As shown in FIG. 3, the third region 131C is located adjacent to thesecond joint section 124 of the second lead 12, in the first directionx. In the second direction y, the third region 131C is located adjacentto the second belt-like section 122A of the second lead 12. The thirdregion 131C includes a grooves 130C. The grooves 130C is located on theleft of the first switching element 31.

As shown in FIG. 2 and FIG. 3, the third terminal section 132 protrudesto the right from the sealing resin 50, when viewed in the thicknessdirection z. The third terminal section 132 is bent, when viewed in thesecond direction y, as shown in FIG. 6. The third terminal section 132may be covered with, for example, a tin-plated layer, or a tin-silveralloy-plated layer.

As shown in FIG. 3, the third joint section 133 serves to connectbetween the plurality of first pad sections 130 and the third terminalsection 132. The third joint section 133 includes an outer joint section133A, a first inner joint section 133B, and a second inner joint section133C.

As shown in FIG. 3, the outer joint section 133A is connected to thefirst region 131A and the third terminal section 132. The outer jointsection 133A extends in the first direction x.

As shown in FIG. 3, the first inner joint section 133B is connected tothe first region 131A and the second region 131B. As shown in FIG. 4,the first inner joint section 133B includes a first belt-like region136A extending from the first region 131A in the first direction x, anda second belt-like region 137A extending from the second region 131B inthe second direction y. At the end of the second belt-like region 137Aconnected to the second region 131B, a groove 133D is provided. Thegroove 133D is recessed from the surface of the third joint section 133.The grooves 133D is formed by the same method as forming the groove130C.

As shown in FIG. 3, the second inner joint section 133C is connected tothe second region 131B and the third region 131C. As shown in FIG. 4,the second inner joint section 133C includes a first belt-like region136B extending from the third region 131C in the first direction x, anda second belt-like region 137B extending from the second region 131B inthe second direction y. At the end of the first belt-like region 136Bconnected to the third region 131C, and at the end of the secondbelt-like region 137B connected to the second region 131B, a groove 133Dis provided.

As shown in FIG. 3, a part of the second region 131B protrudes to theright, from both of the first inner joint section 133B and the secondinner joint section 133C. As shown in FIG. 4, a length La of the secondbelt-like region 137A of the first inner joint section 133B is shorterthan a length Lb of the second belt-like region 137B of the second innerjoint section 133C.

As shown in FIG. 3, the third suspension section 134 extends from thethird region 131C in the second direction y. An end face 134A of thethird suspension section 134 oriented in the second direction y isexposed from the sealing resin 50 (see FIG. 5). The end face 134Aincludes a pair of regions configured to space apart from each other inthe first direction x. At the end of the third suspension section 134connected to the third region 131C, a plurality of grooves 134B areprovided. The plurality of grooves 134B are recessed from the surface ofthe third suspension section 134. The plurality of grooves 134B areformed by the same method as forming the plurality of grooves 130C.

As shown in FIG. 3, the third auxiliary suspension section 135 extendsfrom the outer joint section 133A in the second direction y. An end face135A of the third auxiliary suspension section 135 oriented in thesecond direction y is exposed from the sealing resin 50 (see FIG. 6).

As shown in FIG. 11, the first belt-like section 121 overlaps with thesecond region 131B, the first inner joint section 133B, and the secondinner joint section 133C, when viewed in the first direction x. As shownin FIG. 4, a part of each of the pair of second belt-like sections 122Aand 122B is located between the first inner joint section 133B and thesecond inner joint section 133C.

The plurality of fourth leads 14 are located on the right of the thirdlead 13, as shown in FIG. 3. The plurality of fourth leads 14 eachinclude a second pad section 141 and a fourth terminal section 142.

As shown in FIG. 3, the second switching element 32 is electricallyconnected to each of the second pad sections 141. The second pad section141 includes a main face 141A. The main face 130A may be covered, forexample, with a silver-plated layer.

As shown in FIG. 2 and FIG. 3, the fourth terminal sections 142 eachprotrude to the right from the sealing resin 50, when viewed in thethickness direction z. The fourth terminal sections 142 are eachconnected to the corresponding second pad section 141. The plurality offourth terminal sections 142 are aligned in the second direction y, inalignment with the third terminal section 132. The fourth terminalsections 142 are each bent, when viewed in the second direction y, likethe first to third terminal section (see FIG. 5 and FIG. 6). The fourthterminal sections 142 may be covered, for example, with a tin-platedlayer or a tin-silver alloy-plated layer.

As shown in FIG. 3, the plurality of fourth leads 14 include a U-phaselead 14A, a V-phase lead 14B, and a W-phase lead 14C.

As shown in FIG. 12, a part of the second pad section 141 of the U-phaselead 14A overlaps with the first region 131A, when viewed in the firstdirection x. A part of the second pad section 141 of the U-phase lead14A is located between the outer joint section 133A and the first innerjoint section 133B. As shown in FIG. 3 and FIG. 13, the second padsection 141 of the U-phase lead 14A includes a hole 141B penetratingtherethrough in the thickness direction z. The hole 141B is located onthe right of the second switching element 32. As shown in FIG. 3 andFIG. 15, the second pad section 141 of the U-phase lead 14A includes aplurality of grooves 141C, recessed from the main face 141A. Theplurality of grooves 141C are located along the periphery of the secondswitching element 32. The plurality of grooves 141C are formed by thesame method as forming the plurality of grooves 130C.

As shown in FIG. 3, the second pad section 141 of the V-phase lead 14Bis located adjacent to the second inner joint section 133C, in the firstdirection x. The second pad section 141 of the V-phase lead 14B includesa plurality of grooves 141C. The plurality of grooves 141C are locatedalong the periphery of the second switching element 32.

As shown in FIG. 3, the second pad section 141 of the W-phase lead 14Cis located adjacent to both of the third region 131C and the thirdsuspension section 134, in the first direction x. In the seconddirection y, the second pad section 141 of the W-phase lead 14C islocated adjacent to the second inner joint section 133C. The second padsection 141 of the W-phase lead 14C includes a plurality of grooves141C. The plurality of grooves 141C are located along the periphery ofthe second switching element 32.

The plurality of boot leads 15 are located on the right of the thirdlead 13, as shown in FIG. 3. The plurality of boot leads 15 are eachlocated adjacent to the corresponding fourth lead 14, in the seconddirection y. The boot lead 15 includes a boot connecting section 151 anda boot terminal section 152.

As shown in FIG. 3, at least a part of each of the boot connectingsections 151 is located so as to overlap with the second pad section141, in the second direction y. The surface of the boot connectingsection 151 may be covered, for example, with a silver-plated layer.

As shown in FIG. 2 and FIG. 3, the boot terminal sections 152 eachprotrude to the right from the sealing resin 50, when viewed in thethickness direction z. The boot terminal sections 152 are each connectedto the corresponding boot connecting section 151. The plurality of bootterminal sections 152 are aligned in the second direction y, inalignment with the third terminal section 132 and the plurality offourth terminal sections 142. The boot terminal section 152 is bent whenviewed in the second direction y, like the first to fourth terminalsections. The boot terminal section 152 may be covered, for example,with a tin-plated layer or a tin-silver alloy-plated layer.

The plurality of control leads 16 are located on the left of the firstlead 11, as shown in FIG. 3. The control leads 16 each include a controlconnection section 161 and a control terminal section 162.

As shown in FIG. 3, the mounting base 111 includes a portion protrudingto the left in the first direction x, with respect to the region 113A ofthe first joint section 113 and the first suspension section 114. Theplurality of control connection sections 161 are configured to spaceapart from each other along a generally arcuate curve (or a polyline),and each opposed to the protruding portion of the mounting base 111. Thesurface of the control connection section 161 may be covered, forexample, with a silver-plated layer.

As shown in FIG. 2 and FIG. 3, the control terminal sections 162 eachprotrude to the left from the sealing resin 50, when viewed in thethickness direction z. The control terminal sections 162 are eachconnected to the corresponding control connection section 161. Theplurality of control terminal sections 162 are aligned in the seconddirection y, in alignment with the first terminal section 112 and thesecond terminal section 123. The control terminal sections 162 are bentwhen viewed in the second direction y, as shown in FIG. 6, like otherterminal sections. The control terminal section 162 may be covered, forexample, with a tin-plated layer or a tin-silver alloy-plated layer.

The IC 20 is configured to be mounted on the mounting base 111, as shownin FIG. 3, FIG. 9, and FIG. 10. The IC 20 includes, for example, acontroller circuit 21 and a driver circuit 22 (see FIG. 16). Thecontroller circuit 21 controls the driver circuit 22. The driver circuit22 outputs a gate voltage for driving the plurality of first switchingelements 31 and the plurality of second switching elements 32. The IC 20extends in the first direction x, when viewed in the thickness directionz. A plurality of electrodes 20A are provided on the surface of the IC20. The electrodes 20A are electrically connected to one of thecontroller circuit 21 and the driver circuit 22. As shown in FIG. 3,some of the plurality of electrodes 20A are electrically connectedrespectively to the plurality of first switching elements 31 and theplurality of second switching elements 32. The remaining electrodes 20Aare electrically connected respectively to first lead 11, the secondlead 12, the plurality of boot leads 15, and the plurality of controllead 16. The electrodes 20A may be formed of, for example, aluminum(Al).

As shown in FIG. 9 and FIG. 10, the semiconductor device A10 includes abonding layer 29. The bonding layer 29 is interposed between the mainface 111A of the mounting base 111 and the IC 20. The bonding layer 29is, for example, formed of a silver paste. The silver may be obtained,for example, by mixing fine particles of silver in an epoxy resin. TheIC 20 is bonded to the main face 111A, by means of the bonding layer 29.

The plurality of first switching elements 31 are electrically connectedto the main face 130A of the respective first pad sections 130 (thirdleads 13), as shown in FIG. 3, FIG. 9, and FIG. 10. In the semiconductordevice A10, accordingly, the first switching elements 31 areelectrically connected to the first region 131A, the second region 131B,and the third region 131C, respectively. The plurality of firstswitching elements 31 are electrically connected respectively to theplurality of second pad sections 141 (fourth leads 14). The plurality offirst switching elements 31 may each be a metal-oxide-semiconductorfield-effect transistor (MOSFET) predominantly composed of silicon (Si)or silicon carbide (SiC). Other types of semiconductor element than theMOSFET may be employed as the plurality of first switching elements 31.In this embodiment, it will be assumed that the first switching element31 in the semiconductor device A10 is an n-channel MOSFET. As shown inFIG. 14, the first switching elements 31 each include a first elementmain face 31A, a first element back face 31B, a first main faceelectrode 311, a first back face electrode 312, and a first gateelectrode 313. The first element main face 31A and the first elementback face 31B are oriented in opposite directions, in the thicknessdirection z.

The first main face electrode 311 is provided on the first element mainface 31A, as shown in FIG. 3 and FIG. 14. The first main face electrode311 is the source electrode of the first switching element 31.

As shown in FIG. 14, the first back face electrode 312 is formed so asto cover the entirety of the first element back face 31B. The first backface electrode 312 is the drain electrode of the first switching element31.

The first gate electrode 313 is provided on the first element main face31A, as shown in FIG. 3 and FIG. 14. The first gate electrode 313 is thegate electrode of the first switching element 31. The first gateelectrode 313 is smaller in area than the first main face electrode 311,when viewed in the thickness direction z.

The plurality of second switching elements 32 are electrically connectedto the main face 141A of the respective second pad sections 141 (fourthleads 14), as shown in FIG. 3, FIG. 11, and FIG. 13. In thesemiconductor device A10, accordingly, the second switching element 32are electrically connected to the U-phase lead 14A, the V-phase lead14B, and the W-phase lead 14C, respectively. The plurality of secondswitching elements 32 are electrically connected to the second lead 12.The plurality of second switching elements 32 are the same type ofsemiconductor elements as the plurality of first switching elements 31.As shown in FIG. 15, the second switching elements 32 each include asecond element main face 32A, a second element back face 32B, a secondmain face electrode 321, a second back face electrode 322, and a secondgate electrode 323. The second element main face 32A and the secondelement back face 32B are oriented in opposite directions, in thethickness direction z.

The second main face electrode 321 is provided on the second elementmain face 32A, as shown in FIG. 3 and FIG. 15. The second main faceelectrode 321 is the source electrode of the second switching element32.

As shown in FIG. 15, the second back face electrode 322 is formed so asto cover the entirety of the second element back face 32B. The secondback face electrode 322 is the drain electrode of the second switchingelement 32.

The second gate electrode 323 is provided on the second element mainface 32A, as shown in FIG. 3 and FIG. 15. The second gate electrode 323is the gate electrode of the second switching element 32. The secondgate electrode 323 is smaller in area than the second main faceelectrode 321, when viewed in the thickness direction z.

The semiconductor device A10 includes a plurality of conductive bondinglayers 39, as shown in FIG. 9 to FIG. 15. Some of the plurality ofconductive bonding layers 39 are interposed between the main face 130Aof the respective first pad sections 130, and the first back faceelectrode 312 of the corresponding first switching element 31. Theremaining conductive bonding layers 39 are each interposed between themain face 141A of the second pad sections 141 and the second back faceelectrode 322 of the corresponding second switching element 32. Theplurality of first switching elements 31 are electrically connectedrespectively to the plurality of main faces 130A, by means of thecorresponding conductive bonding layer 39. Accordingly, the plurality offirst back face electrodes 312 are electrically connected to the thirdlead 13. The plurality of second switching elements 32 are electricallyconnected respectively to the plurality of main faces 141A, by means ofthe corresponding conductive bonding layer 39. Accordingly, theplurality of second back face electrodes 322 are electrically connectedrespectively to the plurality of fourth leads 14. The plurality ofconductive bonding layers 39 may be, for example, a lead-free solderpredominantly composed of tin.

The plurality of first wires 41 are each connected between the firstmain face electrode 311 of one of the first switching elements 31, andone of the second pad sections 141, as shown in FIG. 3. The plurality offourth leads 14 are electrically connected respectively to the pluralityof first switching elements 31, by means of the corresponding first wire41. The plurality of first wires 41 may be formed of, for example, gold(Au), copper, silver, or aluminum.

The plurality of second wires 42 are each connected between the secondmain face electrode 321 of one of the second switching elements 32, andthe second lead 12 (pair of second belt-like sections 122A and 122B), asshown in FIG. 3. The plurality of second switching elements 32 areelectrically connected to the second lead 12, by means of thecorresponding second wire 42. The plurality of second wires 42 may beformed of, for example, gold, copper, silver, or aluminum.

The plurality of first gate wires 431, the plurality of second gatewires 432, the plurality of first potential wires 441, the secondpotential wires 442, the plurality of boot wires 45, the ground wire 46,and the plurality of control wires are respectively connected to theplurality of electrodes 20A of the IC 20, as shown in FIG. 3. Thementioned wires may be formed of, for example, gold, copper, silver, oraluminum.

In this embodiment, it will be assumed that the plurality of first wires41, the plurality of second wires 42, the plurality of first gate wires431, the plurality of second gate wires 432, the plurality of firstpotential wires 441, the second potential wire 442, the plurality ofboot wires 45, the ground wire 46, and the plurality of control wires 47are all formed of aluminum. In this case, the plurality of first wires41 and the plurality of second wires 42 are larger in diameter than theplurality of first gate wires 431, the plurality of second gate wires432, the plurality of first potential wires 441, the second potentialwire 442, the plurality of boot wires 45, the ground wire 46, and theplurality of control wires 47. This is because, in the semiconductordevice A10, a larger current runs through the plurality of first wires41 and the plurality of second wires 42, than through the remainingwires. In the case where another material than aluminum (e.g., gold,copper, and silver) is employed to form the plurality of wires in thesemiconductor device A10, the plurality of first wires 41 and theplurality of second wires 42 may be formed in a larger diameter than theremaining wires.

In the semiconductor device A10, the plurality of first wires 41, theplurality of second wires 42, the second potential wire 442, theplurality of boot wires 45, the ground wire 46, and the plurality ofcontrol wires 47 may be formed of copper, and the plurality of firstgate wires 431, the plurality of second gate wires 432, and theplurality of first potential wires 441 may be formed of gold. In thisway, the wires in the semiconductor device A10 may be formed ofdifferent materials, instead of a single material.

The plurality of first gate wires 431 are each connected between one ofthe electrodes 20A of the IC 20, and the first gate electrode 313 of oneof the first switching elements 31, as shown in FIG. 3. The plurality offirst gate electrodes 313 are electrically connected to the drivercircuit 22 of the IC 20, via the respective first gate wires 431 (seeFIG. 16). The gate voltage outputted from the driver circuit 22 isindividually applied to the plurality of first gate electrodes 313, viathe corresponding first gate wire 431.

The plurality of second gate wires 432 are each connected between one ofthe electrodes 20A of the IC 20, and the second gate electrode 323 ofone of the second switching elements 32, as shown in FIG. 3. Theplurality of second gate electrodes 323 are electrically connected tothe driver circuit 22 of the IC 20, via the respective second gate wire432 (see FIG. 16). The gate voltage outputted from the driver circuit 22is individually applied to the plurality of second gate electrodes 323,via the corresponding second gate wire 432.

The plurality of first potential wires 441 are each connected betweenone of the electrodes 20A of the IC 20, and the first main faceelectrode 311 of one of the first switching elements 31, as shown inFIG. 3. The plurality of first main face electrodes 311 are electricallyconnected to the driver circuit 22 of the IC 20, via the respectivefirst potential wires 441 (see FIG. 16). The plurality of first mainface electrodes 311 are electrically connected respectively to theplurality of fourth leads 14. A negative potential of the gate powersupply for generating the gate voltage to drive the plurality of firstswitching elements 31 differs with respect to each of the firstswitching elements 31. In addition, it is required that the gate voltageis higher than the gate voltage for driving the plurality of secondswitching elements 32. From such a viewpoint, the gate power supply forgenerating the gate voltage for the first switching elements 31 includesa plurality of capacitors C shown in FIG. 16, electrically connected tothe semiconductor device A10. The plurality of capacitors C arerespectively associated with the plurality of first switching elements31. The plurality of first potential wires 441 transmit the negativepotential of the respective capacitors C, to the driver circuit 22 ofthe IC 20.

The second potential wire 442 is connected between one of the electrodes20A of the IC 20 and the second lead 12, as shown in FIG. 3. The secondmain face electrode 321 of each of the second switching elements 32 iselectrically connected to the controller circuit 21 of the IC 20, viathe second wire 42, the second lead 12, and the second potential wire442 (see FIG. 16). This means that the negative potential of the gatepower supply for generating the gate voltage to drive the plurality ofsecond switching elements 32 is common to all of the second switchingelements 32. The gate power supply is included in the power supply fordriving the IC 20. The second potential wire 442 transmits the potentialof the second main face electrode 321 of the plurality of secondswitching elements 32 to the controller circuit 21 of the IC 20. Inaddition, the source current from the plurality of second switchingelements 32 is detected by the controller circuit 21, via the secondpotential wire 442.

The plurality of boot wires 45 are respectively connected between theplurality of electrodes 20A of the IC 20 and the plurality of bootconnecting sections 151, as shown in FIG. 3. The plurality of boot leads15 are electrically connected to the driver circuit 22 of the IC 20, viathe respective boot wires 45 (see FIG. 16).

The ground wire 46 is connected between one of the electrodes 20A of theIC 20 and the first joint section 113, as shown in FIG. 3. The firstlead 11 is electrically connected to the controller circuit 21 of the IC20, via the ground wire 46 (see FIG. 16).

The plurality of control wires 47 are respectively connected between theplurality of electrodes 20A of the IC 20 and the plurality of controlconnection sections 161, as shown in FIG. 3. The plurality of controlleads 16 are electrically connected to the controller circuit 21 of theIC 20, via the respective control wires 47 (see FIG. 16).

The sealing resin 50 is arranged to cover, as shown in FIG. 3, a part ofeach of the first lead 11, the second lead 12, the third lead 13, theplurality of fourth leads 14, the plurality of boot leads 15, and theplurality of control leads 16. The sealing resin 50 is arranged also tocover the IC 20, the plurality of first switching elements 31, and theplurality of second switching elements 32, as shown in FIG. 3. Thesealing resin 50 may be formed of, for example, a black epoxy resin. Asshown in FIG. 2 and FIG. 5 to FIG. 8, the sealing resin 50 includes apair of first side faces 51A and 51B, and a pair of second side faces52A and 52B.

As shown in FIG. 2, FIG. 7, and FIG. 8, the pair of first side faces 51Aand 51B are configured to space apart from each other in the firstdirection x. In FIG. 2, the first side face 51A is oriented to theright, and the first side face 51B is oriented to the left. The thirdterminal section 132, the plurality of fourth terminal sections 142, andthe plurality of boot terminal sections 152 protrude to the right fromthe first side face 51A, when viewed in the thickness direction z.Likewise, the first terminal section 112, the second terminal section123, and the plurality of control terminal sections 162 protrude to theleft from the first side face 51B, when viewed in the thicknessdirection z.

As shown in FIG. 2, FIG. 5, and FIG. 6, the pair of second side faces52A and 52B are configured to space apart from each other in the seconddirection y. In FIG. 2, the second side face 52A is oriented upward, andthe second side face 52B is oriented downward. As shown in FIG. 6, anend face 114A of the first suspension section 114, an end face 125A ofthe second suspension section 125, and an end face 135A of the thirdauxiliary suspension section 135 are exposed from the second side face52A. As shown in FIG. 5, an end face 126A of the second auxiliarysuspension section 126, an end face 134A of the third suspension section134, and an end face 141D of the second pad section 141 (W-phase lead14C) are exposed from the second side face 52B.

Referring now to FIG. 16, a circuit configuration of the semiconductordevice A10 will be described hereunder.

The plurality of fourth terminal sections 142 include a U-phase outputterminal 142A, a V-phase output terminal 142B, and a W-phase outputterminal 142C. The U-phase output terminal 142A corresponds to thefourth terminal section 142 of the U-phase lead 14A. The V-phase outputterminal 142B corresponds to the fourth terminal section 142 of theV-phase lead 14B. The W-phase output terminal 142C corresponds to thefourth terminal section 142 of the W-phase lead 14C. The plurality ofcontrol terminal sections 162 include a VCC terminal 162A, a VSPterminal 162B, a pair of HU terminals 162C, a pair of HV terminals 162D,a pair of HW terminals 162E, an FGS terminal 162F, an FG terminal 162G,and an RT terminal 162H.

As shown in FIG. 16, a motor 80, the target of the operation control, isconnected to the semiconductor device A10. The motor 80 is a brushlessDC motor. The motor 80 is electrically connected to the U-phase outputterminal 142A, the V-phase output terminal 142B, the W-phase outputterminal 142C, the pair of HU terminals 162C, the pair of HV terminals162D, and the pair of HW terminals 162E. The U-phase output terminal142A, the V-phase output terminal 142B, and the W-phase output terminal142C are electrically connected respectively to three stators (notshown) of the motor 80. The pair of HU terminals 162C, the pair of HVterminals 162D, and the pair of HW terminals 162E are electricallyconnected respectively to three Hall elements (not shown) providedinside the motor 80.

The controller circuit 21 of the IC 20 includes a Hall amplifier 211, atriangular wave generator 212, a PWM signal converter 213, an overcurrent protector 214, a first under-voltage protector 215, and athree-phase distribution logic 216.

The Hall amplifier 211 is electrically connected to the pair of HUterminals 162C, the pair of HV terminals 162D, and the pair of HWterminals 162E, via the respective control wires 47. The Hall amplifier211 amplifies each of three Hall voltages outputted from the Hallelement provided inside the motor 80. The Hall voltages are signals eachindicating a position around the axial line of the rotor (not shown) ofthe motor 80. The three Hall voltages amplified by the Hall amplifier211 are inputted to the three-phase distribution logic 216.

The triangular wave generator 212 is electrically connected to the RTterminal 162H, via the control wire 47. The triangular wave generator212 generates a triangular wave, according to the signal inputted to theRT terminal 162H. The triangular wave serves as a carrier signal forcontrolling the driver circuit 22 through a pulse width modulation (PWM)control. The carrier signal is inputted to the PWM signal converter 213.

The PWM signal converter 213 is electrically connected to the VSPterminal 162B, via the control wire 47. From the VSP terminal 162B, amodulation wave signal that serves as the base for driving the motor 80is inputted. The modulation wave signal has a sine wave form. The PWMsignal converter 213 converts the carrier signal inputted from thetriangular wave generator 212 and the modulation wave signal inputtedfrom the VSP terminal 162B into a PWM signal, which has a pulse waveform, according to the comparison therebetween. The PWM signal isinputted to the three-phase distribution logic 216.

The over current protector 214 is electrically connected to theplurality of second switching elements 32, via the second potential wire442, the second lead 12, and the plurality of second wires 42. The overcurrent protector 214 detects the source current running through theplurality of second switching elements 32. The over current protector214 generates a signal based on the detection result of the sourcecurrent. The signal is inputted to the three-phase distribution logic216.

The first under-voltage protector 215 is electrically connected to theVCC terminal 162A, via the control wire 47. To the VCC terminal 162A,the current for driving the IC 20 is inputted. Accordingly, thepotential at the VCC terminal 162A corresponds to the positive potentialof the power supply for driving the IC 20. The first under-voltageprotector 215 prevents a voltage applied by the VCC terminal 162A to theIC 20 from falling below a threshold.

The three-phase distribution logic 216 distributes the PWM signalinputted from the PWM signal converter 213 to three phases, namely thepair of U-phase signals, the pair of V-phase signals, and the pair ofW-phase signals, according to the Hall voltage inputted from the Hallamplifier 211. In the semiconductor device A10, the pair of U-phasesignals, the pair of V-phase signals, and the pair of W-phase signalsare each a rectangular wave signal of a 120 degrees conduction type. Thephase difference of the V-phase signal from the U-phase signal, and thephase difference of the W-phase signal from the V-phase signal, are both120 degrees. One each of the U-phase signals, the V-phase signals, andthe W-phase signals are inputted to a high-side region 221A (to besubsequently described in detail) of a gate driver 221 of the drivercircuit 22. The other of each of the U-phase signals, the V-phasesignals, and the W-phase signals are inputted to a low-side region 221B(to be subsequently described in detail) of the gate driver 221 of thedriver circuit 22. The pair of U-phase signals, the pair of V-phasesignals, and the pair of W-phase signals are adjusted as appropriate,according to the signal inputted from the over current protector 214.

The three-phase distribution logic 216 is electrically connected to thefirst terminal section 112, via the ground wire 46. The first terminalsection 112 is the ground terminal of the IC 20. Accordingly, thepotential at the first terminal section 112 corresponds to the negativepotential of the power supply for driving the IC 20. The three-phasedistribution logic 216 is also electrically connected to the FG terminal162G and the FGS terminal 162F, via the pair of control wires 47. Thethree-phase distribution logic 216 generates a frequency generator (FG)signal indicating the rotation speed of the motor 80, according to theHall voltage inputted from the Hall amplifier 211. The FG signal isoutputted to the FG terminal 162G. To the FGS terminal 162F, a commandsignal for determining the number of pulses of the FG signal outputtedfrom the FG terminal 162G, is inputted.

The driver circuit 22 of the IC 20 includes the gate driver 221 and aplurality of second under-voltage protectors 222.

The gate driver 221 drives each of the plurality of first switchingelements 31 and the plurality of second switching elements 32, accordingto the pair of U-phase signals, the pair of V-phase signals, and thepair of W-phase signals inputted from the three-phase distribution logic216. The gate driver 221 includes the high-side region 221A and thelow-side region 221B.

In the high-side region 221A, a plurality of drive circuits areprovided. The plurality of drive circuits in the high-side region 221Arespectively convert one each of the U-phase signals, the V-phasesignals, and the W-phase signals, inputted from the three-phasedistribution logic 216, into a plurality of gate voltages. The pluralityof such gate voltages respectively correspond to the positive potentialof the U-phase signal, the V-phase signal, and the W-phase signal. Theplurality of such gate voltages are respectively applied to theplurality of first switching elements 31, via the plurality of firstgate wires 431. This is how the plurality of first switching elements 31are driven.

In the low-side region 221B, a plurality of drive circuits are provided.The plurality of drive circuits in the low-side region 221B respectivelyconvert the other of each of the U-phase signals, the V-phase signals,and the W-phase signals, inputted from the three-phase distributionlogic 216, into a plurality of gate voltages. The plurality of such gatevoltages respectively correspond to the negative potential of theU-phase signal, the V-phase signal, and the W-phase signal. Theplurality of such gate voltages are respectively applied to theplurality of second switching elements 32, via the plurality of secondgate wires 432. This is how the plurality of second switching elements32 are driven.

The plurality of second under-voltage protectors 222 are electricallyconnected respectively to the plurality of drive circuits provided inthe high-side region 221A of the gate driver 221. The plurality ofsecond under-voltage protectors 222 respectively prevent the voltageapplied to the drive circuits from the plurality of capacitors C, fromfalling below a threshold.

In the semiconductor device A10, a DC power for driving the motor 80 isinputted to the third terminal section 132. The current of the DC powerinputted to the third terminal section 132 sequentially flows throughthe plurality of first switching elements 31, the plurality of firstwires 41, the plurality of second switching elements 32, and theplurality of second wires 42, and is outputted from the second terminalsection 123.

The DC power inputted to the semiconductor device A10 is converted intoa three-phase AC power, having the U-phase, the V-phase, and theW-phase, when the plurality of first switching elements 31 and theplurality of second switching elements 32 are driven. The U-phase ACpower is outputted from the U-phase output terminal 142A. The V-phase ACpower is outputted from the V-phase output terminal 142B. The W-phase ACpower is outputted from the W-phase output terminal 142C. The motor 80is driven by the three-phase AC power, outputted from the U-phase outputterminal 142A, the V-phase output terminal 142B, and the W-phase outputterminal 142C.

The plurality of capacitors C are each electrically connected to both ofthe fourth terminal section 142, and the boot terminal section 152located adjacent thereto in the second direction y. The plurality ofcapacitors C are each charged with the power inputted to the VCCterminal 162A, when the second switching element 32, electricallyconnected to the first switching element 31 corresponding to thecapacitor C, is on. The conduction path from the VCC terminal 162A tothe capacitor C includes the control wire 47, a resistance R, a diode D,the boot wire 45, and the boot terminal section 152. The power chargedto each of the plurality of capacitors C is inputted to one of the drivecircuits provided in the high-side region 221A of the gate driver 221,via the boot terminal section 152, the boot wire 45, and the secondunder-voltage protector 222. Here, the plurality of first potentialwires 441 are electrically connected respectively to the plurality ofdrive circuits.

The semiconductor device A10 provides the following advantageouseffects.

The semiconductor device A10 includes the first lead 11 having themounting base 111 elongate in the first direction x, and the second lead12 including the first belt-like section 121 and the pair of secondbelt-like sections 122 (122A and 122B). The first belt-like section 121is shifted from the mounting base 111 in the first direction x, andelongate in the second direction y. The second belt-like sections 122each extend in the first direction x (to the left in FIG. 3), from thecorresponding end 121A of the first belt-like section 121. The mountingbase 111 overlaps with the first belt-like section 121, when viewed inthe first direction x. At least a part of the mounting base 111 islocated between the pair of second belt-like sections 122. The mentionedconfiguration enables reduction in outer size of the semiconductordevice A10 in the second direction y, while keeping the outer size ofthe semiconductor device A10 in the first direction x at a predeterminedvalue. In other words, the semiconductor device can be formed in areduced size.

The first lead 11 includes the first joint section 113 (connected to themounting base 111 and the first terminal section 112) and the firstsuspension section 114 (on the opposite side of the first joint section113 in the second direction y, with respect to the mounting base 111).Accordingly, the mounting base 111 is supported on both sides in thesecond direction y, in the manufacturing process of the semiconductordevice A10. Therefore, the mounting base 111 can be prevented fromexcessively tilting, when the IC 20 is mounted on the mounting base 111.

The second lead 12 includes the second joint section 124 (connected toone of the second belt-like sections 122 and the second terminal section123) and the second suspension section 125 (extending from the othersecond belt-like section 122 in the second direction y). Accordingly,the first belt-like section 121 and the pair of second belt-likesections 122 are supported on both sides in the second direction y, inthe manufacturing process of the semiconductor device A10. Therefore,the pair of second belt-like sections 122 can be prevented fromexcessively tilting, when the plurality of second wires 42 are connectedto the pair of second belt-like sections 122.

In FIG. 3, the first joint section 113 is located on the left of thepair of second belt-like sections 122, in the first direction x. Thefirst joint section 113 includes the region 113A, inclined with respectto both of the first direction x and the second direction y. Such aconfiguration prevents the outer size of the semiconductor device A10 inthe first direction x from being excessively large.

The second terminal section 123 is located adjacent to the firstterminal section 112 in the second direction y, and the second jointsection 124 is located adjacent to the first joint section 113. Thesecond joint section 124 includes the region 124A, inclined with respectto both of the first direction x and the second direction y. Such aconfiguration shortens the distance between the second joint section 124and the first joint section 113 (region 113A).

In FIG. 3, the third lead 13 is located on the right of the second lead12, in the first direction x. The plurality of first pad sections 130 ofthe third lead 13 include the first region 131A, the second region 131B,and the third region 131C, respectively. The first region 131A islocated adjacent to the second suspension section 125, in the firstdirection x. The second region 131B is located adjacent to the firstbelt-like section 121, in the first direction x. The third region 131Cis located adjacent to the second joint section 124, in the firstdirection x. Accordingly, the plurality of first switching elements 31can be located along the outer periphery of the first belt-like section121 and the pair of second belt-like sections 122. Such a configurationcontributes to reducing the outer size of the semiconductor device A10in the second direction y.

The third joint section 133 of the third lead 13 includes the firstinner joint section 133B (connected to the first region 131A and thesecond region 131B) and the second inner joint section 133C (connectedto the second region 131B and the third region 131C). The firstbelt-like section 121 overlaps with the second region 131B, the firstinner joint section 133B, and the second inner joint section 133C, whenviewed in the first direction x. A part of each of the pair of secondbelt-like sections 122 is located between the first inner joint section133B and the second inner joint section 133C. Such a configurationshortens the distance between the third joint section 133, and the firstbelt-like section 121 and the pair of second belt-like sections 122.

In FIG. 3 and FIG. 4, the second region 131B protrudes with respect tothe first inner joint section 133B and the second inner joint section133C in the first direction x, and in the direction away from the firstbelt-like section 121. Such a configuration allows the distance betweenthe second region 131B and the first belt-like section 121 to beshortened.

The third joint section 133 includes the outer joint section 133Aconnected to the first region 131A and the third terminal section 132.The third lead 13 includes the third suspension section 134 extendingfrom the second inner joint section 133C in the second direction y.Accordingly, the plurality of first pad sections 130, the first innerjoint section 133B, and the second inner joint section 133C aresupported by both of the outer joint section 133A and the thirdsuspension section 134, in the manufacturing process of thesemiconductor device A10. Therefore, the plurality of first pad sections130 can be prevented from excessively tilting, when the plurality offirst switching elements 31 are to be bonded to the plurality of firstpad sections 130.

The second pad section 141 of the U-phase lead 14A (fourth lead 14)overlaps with the first region 131A, when viewed in the first directionx. In FIG. 3, a part of the second pad section 141 is located betweenthe outer joint section 133A and the first inner joint section 133B.Such a configuration allows the second switching element 32 to belocated on the right of the first switching element 31 bonded to thefirst region 131A, in the first direction x.

The first inner joint section 133B includes the second belt-like region137A extending from the second region 131B in the second direction y.The second inner joint section 133C includes the second belt-like region137B extending from the second region 131B in the second direction y. Asshown in FIG. 4, the length La of the second belt-like region 137A isshorter than the length Lb of the second belt-like region 137B. Such aconfiguration allows a space for locating the V-phase lead 14B and theW-phase lead 14C to be secured on the opposite side of the U-phase lead14A in the second direction y, with respect to the second region 131B.

When viewed in the thickness direction z, the IC 20 has a belt-likeshape extending in the first direction x, like the mounting base 111.Accordingly, the main face 111A of the mounting base 111 can beeffectively utilized to mount the IC 20. In addition, forming the IC 20in the elongate shape allows the controller circuit 21 and the drivercircuit 22 to be integrally incorporated in the IC 20.

Referring now to FIG. 17 to FIG. 22, a semiconductor device A20according to a second embodiment will be described hereunder. In thesedrawings, the elements same as or similar to those of the semiconductordevice A10 are given the same numeral, and the description thereof willnot be repeated.

The semiconductor device A20 includes the first lead 11, the second lead12, a plurality of arm leads 17, the plurality of boot leads 15, theplurality of control leads 16, the IC 20, a control IC 28, the pluralityof first switching elements 31, the plurality of second switchingelements 32, and the sealing resin 50. The semiconductor device A20 alsoincludes the plurality of first wires 41, the plurality of second wires42, the plurality of first gate wires 431, the plurality of second gatewires 432, the plurality of first potential wires 441, the secondpotential wire 442, the plurality of boot wires 45, a plurality ofground wires 46, and the plurality of control wires 47. In FIG. 17, thementioned elements are seen through the sealing resin 50, for the sakeof clarity (see dash-dot-dot lines). FIG. 20 to FIG. 22 arecross-sectional views taken along dash-dot lines (XX-XX, XXI-XXI,XXII-XXII) in FIG. 17.

The semiconductor device A20 is applicable, for example, to control ofthe operation of a DC motor. A DC power supplied from outside to thesemiconductor device A20 is controlled by the plurality of firstswitching elements 31 and the plurality of second switching elements 32.

The first lead 11, the second lead 12, the plurality of arm leads 17,the plurality of boot leads 15, and the plurality of control leads 16are conductive materials constituted of the same lead frame. Theseconductive materials constitute a part of the conduction path betweenthe IC 20, the control IC 28, the plurality of first switching elements31, and the plurality of second switching elements 32, and a circuitboard on which the IC 20 is mounted. The lead frame may be formed ofcopper (Cu) or a copper-based alloy. The plurality of control leads 16have the same configuration as those of the semiconductor device A10.

The first lead 11 includes the mounting base 111, the first terminalsection 112, the first joint section 113, and a pair of first suspensionsections 114, as shown in FIG. 17.

As shown in FIG. 17, the mounting base 111 occupies the largest area inthe first lead 11, when viewed in the thickness direction z. As shown inFIG. 20 and FIG. 21, the mounting base 111 includes the main face 111Aoriented in the thickness direction z. The main face 111A may becovered, for example, with a silver-plated layer.

As shown in FIG. 17, the first terminal section 112 protrudes to theleft from the sealing resin 50 in the first direction x, when viewed inthe thickness direction z. The first terminal section 112 has the sameconfiguration as that of the semiconductor device A10.

As shown in FIG. 17, the first joint section 113 is connected to themounting base 111 and the first terminal section 112. The surface of thefirst joint section 113 (seen in FIG. 17) may be covered, for example,with a silver-plated layer.

As shown in FIG. 17, the pair of first suspension sections 114 arelocated on the opposite side of the first joint section 113 in thesecond direction y, with respect to the mounting base 111. The pair offirst suspension sections 114 extend in the second direction y.Accordingly, the mounting base 111 is interposed between the first jointsection 113 and the pair of first suspension sections 114, in the seconddirection y. The pair of first suspension sections 114 each include anend face 114A oriented in the second direction y. The pair of end faces114A are exposed from the sealing resin 50 (see FIG. 19).

The second lead 12 is located on the right of the first lead 11 in thefirst direction x, as shown in FIG. 17. The second lead 12 includes thefirst belt-like section 121, the second belt-like section 122, thesecond terminal section 123, the second joint section 124, and thesecond suspension section 125.

As shown in FIG. 17, the first belt-like section 121 is located on theright of the mounting base 111, in the first direction x. The firstbelt-like section 121 extends in the second direction y. As shown inFIG. 21, the mounting base 111 overlaps with the first belt-like section121, when viewed in the first direction x.

As shown in FIG. 17, the second belt-like section 122 extends to theleft in the first direction x, from an end of the first belt-likesection 121 in the second direction y. The first belt-like section 121and the second belt-like section 122 are generally orthogonal to eachother, when viewed in the thickness direction z. The second belt-likesection 122 is located adjacent to the mounting base 111, in the seconddirection y. The respective surfaces of the first belt-like section 121and the second belt-like section 122 may be covered, for example, with asilver-plated layer.

As shown in FIG. 17, the second terminal section 123 protrudes to theleft from the sealing resin 50 in the first direction x, when viewed inthe thickness direction z. The second terminal section 123 has the sameconfiguration as that of the semiconductor device A10.

As shown in FIG. 17, the second joint section 124 is connected to thesecond belt-like section 122 and the second terminal section 123. Thesecond joint section 124 is located adjacent to the first joint section113, in the second direction y. The surface of the second joint section124 may be covered, for example, with a silver-plated layer.

As shown in FIG. 17, the second suspension section 125 extends in thesecond direction y, from a portion of the second joint section 124extending in the first direction x. The end face 125A of the secondauxiliary suspension section 126 oriented in the second direction y isexposed from the sealing resin 50.

The plurality of arm leads 17 is located on the right of the second lead12 in the first direction x, as shown in FIG. 17. The plurality of armleads 17 include a first arm lead 171, a second arm lead 172, a thirdarm lead 173, and a fourth arm lead 174.

As shown in FIG. 17, the first arm lead 171 includes a pad section 171A,a first power supply terminal section 171B, a second power supplyterminal section 171C, and a joint section 171D.

The pad section 171A is located adjacent to the first belt-like section121, in the first direction x. The surface of the pad section 171A maybe covered, for example, with a silver-plated layer.

The first power supply terminal section 171B protrudes to the right fromthe sealing resin 50 in the first direction x, when viewed in thethickness direction z. The first power supply terminal section 171B isconnected to the pad section 171A. As shown in FIG. 19, the first powersupply terminal section 171B is bent, when viewed in the seconddirection y. The fourth terminal section 142 may be covered, forexample, with a tin-plated layer or a tin-silver alloy-plated layer.

In FIG. 17, the second power supply terminal section 171C protrudes tothe right from the sealing resin 50 in the first direction x, whenviewed in the thickness direction z. The second power supply terminalsection 171C is bent like the first power supply terminal section 171Bshown in FIG. 19, when viewed in the second direction y. The secondpower supply terminal section 171C may be covered, for example, with atin-plated layer or a tin-silver alloy-plated layer.

The joint section 171D is connected to the pad section 171A and thesecond power supply terminal section 171C. The joint section 171Dincludes a portion extending from the pad section 171A in the seconddirection y, and a portion extending from the second power supplyterminal section 171C in the first direction x. Accordingly, the jointsection 171D has an L-shape, when viewed in the thickness direction z.

As shown in FIG. 17, the second arm lead 172 includes a pad section 172Aand a third power supply terminal section 172B.

The pad section 172A is located adjacent to the joint section 171D ofthe first arm lead 171, in the second direction y. The surface of thepad section 172A may be covered, for example, with a silver-platedlayer.

The third power supply terminal section 172B protrudes to the right fromthe sealing resin 50 in the first direction x, when viewed in thethickness direction z. The third power supply terminal section 172B isconnected to the pad section 172A. The third power supply terminalsection 172B is bent like the first power supply terminal section 171Bshown in FIG. 19, when viewed in the second direction y. The third powersupply terminal section 172B is located adjacent to the second powersupply terminal section 171C, in the second direction y. The third powersupply terminal section 172B may be covered, for example, with atin-plated layer or a tin-silver alloy-plated layer.

As shown in FIG. 17, the third arm lead 173 includes a pad section 173Aand a first output terminal section 173B.

The pad section 173A is located adjacent to the joint section 171D ofthe first arm lead 171, in the second direction y. In addition, the padsection 173A is located on the opposite side of the pad section 172A ofthe second arm lead 172 in the second direction y, with respect to thejoint section 171D. The surface of the pad section 173A may be covered,for example, with a silver-plated layer.

The first output terminal section 173B protrudes to the right from thesealing resin 50 in the first direction x, when viewed in the thicknessdirection z. The first output terminal section 173B is connected to thepad section 173A. The first output terminal section 173B is bent likethe first power supply terminal section 171B shown in FIG. 19, whenviewed in the second direction y. The first output terminal section 173Bmay be covered, for example, with a tin-plated layer or a tin-silveralloy-plated layer.

As shown in FIG. 17, the fourth arm lead 174 includes a pad section 174Aand a second output terminal section 174B.

The pad section 174A is located adjacent to the second joint section 124in the first direction x, and to the second belt-like section 122 in thesecond direction y. The surface of the pad section 173A may be covered,for example, with a silver-plated layer.

The second output terminal section 174B protrudes to the right from thesealing resin 50 in the first direction x, when viewed in the thicknessdirection z. The second output terminal section 174B is connected to thepad section 174A. As shown in FIG. 18, the second output terminalsection 174B is bent, when viewed in the second direction y. The secondoutput terminal section 174B may be covered, for example, with atin-plated layer or a tin-silver alloy-plated layer.

The plurality of boot leads 15 are located on the right of the secondlead 12 in the first direction x, as shown in FIG. 17. The plurality ofboot leads 15 include a first boot lead 15A and a second boot lead 15B.

As shown in FIG. 17, the first boot lead 15A includes a first bootconnecting section 151A and a first boot terminal section 152A.

The first boot connecting section 151A is located between the padsection 171A of the first arm lead 171 and the pad section 173A of thethird arm lead 173. The first boot connecting section 151A extends inthe first direction x. The surface of the first boot connecting section151A may be covered, for example, with a silver-plated layer.

The first boot terminal section 152A protrudes to the right from thesealing resin 50 in the first direction x, when viewed in the thicknessdirection z. The first boot terminal section 152A is bent like the firstpower supply terminal section 171B shown in FIG. 19, when viewed in thesecond direction y. The first boot terminal section 152A is locatedadjacent to the first output terminal section 173B, in the seconddirection y. The first boot terminal section 152A may be covered, forexample, with a tin-plated layer or a tin-silver alloy-plated layer.

As shown in FIG. 17, the second boot lead 15B includes a second bootconnecting section 151B and a second boot terminal section 152B.

The second boot connecting section 151B is located between the padsection 172A of the second arm lead 172 and the pad section 174A of thefourth arm lead 174. The second boot connecting section 151B includes aportion extending in the first direction x, and a portion extendingtherefrom in the second direction y. Accordingly, the second bootconnecting section 151B has an L-shape when viewed in the thicknessdirection z. The surface of the second boot connecting section 151B maybe covered, for example, with a silver-plated layer.

The second boot terminal section 152B protrudes to the right from thesealing resin 50 in the first direction x, when viewed in the thicknessdirection z. The second boot terminal section 152B is bent like thesecond output terminal section 174B shown in FIG. 18, when viewed in thesecond direction y. The second boot terminal section 152B is locatedadjacent to the second output terminal section 174B, in the seconddirection y. The second boot terminal section 152B may be covered, forexample, with a tin-plated layer or a tin-silver alloy-plated layer.

The IC 20 is mounted on the mounting base 111, as shown in FIG. 17. Asshown in FIG. 20 and FIG. 21, the IC 20 is bonded to the main face 111Aof the mounting base 111, by means of the bonding layer 29. In thesemiconductor device A20, the IC 20 outputs a gate voltage for drivingthe plurality of first switching elements 31 and the plurality of secondswitching elements 32. Some of the plurality of electrodes 20A of the IC20 are electrically connected respectively to the plurality of firstswitching elements 31 and the plurality of second switching elements 32.The remaining electrodes 20A are electrically connected respectively tofirst lead 11, the plurality of boot leads 15, and the control lead 16.

The control IC 28 is mounted on the mounting base 111 as shown in FIG.17, and located on the left of the IC 20 in the first direction x. Thecontrol IC 28 controls the IC 20. On the surface of the control IC 28, aplurality of electrodes 28A are provided. Some of the plurality ofelectrodes 28A are electrically connected respectively to some of theplurality of electrodes 20A of the IC 20. The remaining electrodes 28Aare electrically connected respectively to the first lead 11, the secondlead 12, and the plurality of control leads 16. The plurality ofelectrodes 28A may be formed of, for example, aluminum.

The plurality of first switching elements 31 include, as shown in FIG.17, a first element 310A and a second element 310B. The plurality offirst switching elements 31 have the same configuration as those of thesemiconductor device A10.

As shown in FIG. 17 and FIG. 22, the first element 310A is conductivelybonded to the pad section 171A of the first arm lead 171, by means ofthe conductive bonding layer 39. Accordingly, the first back faceelectrode 312 of the first element 310A is electrically connected to thefirst arm lead 171.

As shown in FIG. 17 and FIG. 22, the second element 310B is conductivelybonded to the pad section 172A of the second arm lead 172, by means ofthe conductive bonding layer 39. Accordingly, the first back faceelectrode 312 of the second element 310B is electrically connected tothe second arm lead 172.

The plurality of second switching elements 32 include, as shown in FIG.17, a third element 320A and a fourth element 320B. The plurality ofsecond switching elements 32 have the same configuration as those of thesemiconductor device A10.

As shown in FIG. 17, FIG. 20, and FIG. 22, the third element 320A isconductively bonded to the pad section 173A of the third arm lead 173,by means of the conductive bonding layer 39. Accordingly, the first backface electrode 312 of the third element 320A is electrically connectedto the third arm lead 173.

As shown in FIG. 17 and FIG. 21, the fourth element 320B is conductivelybonded to the pad section 174A of the fourth arm lead 174, by means ofthe conductive bonding layer 39. Accordingly, the first back faceelectrode 312 of the fourth element 320B is electrically connected tothe fourth arm lead 174.

The plurality of first wires 41 include two wires, in the example shownin FIG. 17. One of the first wires 41 is connected between the firstmain face electrode 311 of the first element 310A and the pad section173A of the third arm lead 173, and therefore the first element 310A andthe third arm lead 173 are electrically connected to each other. Theother first wire 41 is connected between the first main face electrode311 of the second element 310B and the pad section 174A of the fourtharm lead 174, and therefore the second element 310B and the fourth armlead 174 are electrically connected to each other.

The plurality of second wires 42 include two wires, in the example shownin FIG. 17. One of the second wires 42 is connected between the secondmain face electrode 321 of the third element 320A and the firstbelt-like section 121, and therefore the third element 320A and thesecond lead 12 are electrically connected to each other. The othersecond wire 42 is connected between the second main face electrode 321of the fourth element 320B and the second belt-like section 122, andtherefore the fourth element 320B and the second lead 12 areelectrically connected to each other.

The plurality of first potential wires 441 are, as shown in FIG. 17,respectively connected to the plurality of electrodes 20A of the IC 20,and the first main face electrode 311 of the plurality of firstswitching elements 31. By means of the plurality of first potentialwires 441, the first main face electrode 311 of the first element 310A,and the first main face electrode 311 of the second element 310B areelectrically connected to the IC 20. In the semiconductor device A20also, as in the semiconductor device A10, the gate power supply thatgenerates the gate voltage for driving the first element 310A and thesecond element 310B includes the plurality of capacitors C (see FIG. 23)electrically connected to the semiconductor device A20. The plurality ofcapacitors C are respectively associated with the first element 310A andthe second element 310B. The negative potential of each of thecapacitors C is transmitted to the IC 20, via the corresponding firstpotential wire 441.

The second potential wire 442 is, as shown in FIG. 17, connected betweenthe electrode 28A of the control IC 28 and the second lead 12. Thesecond main face electrode 321 of the third element 320A, and the secondmain face electrode 321 of the fourth element 320B are electricallyconnected to the control IC 28, via the plurality of second wires 42,the second lead 12, and the second potential wire 442. The secondpotential wire 442 transmits the potential at the second main faceelectrode 321 of the third element 320A, and the second main faceelectrode 321 of the fourth element 320B, to the control IC 28.

The plurality of boot wires 45 are, as shown in FIG. 17, respectivelyconnected to the plurality of electrodes 20A of the IC 20, the firstboot connecting section 151A, and the second boot connecting section151B. The first boot lead 15A and the second boot lead 15B areelectrically connected to the IC 20, via the plurality of boot wires 45.

The plurality of ground wires 46 include two wires, in the example shownin FIG. 17. One of the ground wires 46 is connected between theelectrode 20A of the IC 20 and the mounting base 111. The other groundwire 46 is connected between the electrode 28A of the control IC 28 andthe first joint section 113. Accordingly, the first lead 11 iselectrically connected to both of the IC 20 and the control IC 28.

As shown in FIG. 17, the plurality of control wires 47 can be classifiedinto three groups, according to the connection target. One of thecontrol wires 47 of a first group connects between one of the electrodes28A of the control IC 28, and a corresponding control connection section161. One of the control wires 47 of a second group connects between oneof the electrodes 28A of the control IC 28, and a correspondingelectrode 20A of the IC 20. One of the control wires 47 of a third groupconnects between one of the electrodes 20A of the IC 20, and acorresponding control connection section 161.

As is apparent from FIG. 17, the sealing resin 50 is arranged to cover apart of each of the first lead 11, the second lead 12, the plurality ofarm leads 17, the plurality of boot leads 15, and the plurality ofcontrol leads 16. The sealing resin 50 is arranged also to cover the IC20, the control IC 28, the plurality of first switching elements 31, andthe plurality of second switching elements 32 (see also FIG. 20 to FIG.22).

As shown in FIG. 19, the respective end faces 114A of the pair of firstsuspension sections 114, and the end face 121B of the first belt-likesection 121 are exposed from the second side face 52A. As shown in FIG.18, the end face 125A of the second suspension section 125, and theplurality of end faces 174C of the pad section 174A (fourth arm lead174) oriented in the second direction y, are exposed from the secondside face 52B.

Referring to FIG. 23, the control of the motor 80, performed by thesemiconductor device A20, will be described hereunder.

As shown in FIG. 23, the motor 80, which is the target of the control,is connected to the first output terminal section 173B and the secondoutput terminal section 174B of the semiconductor device A20. The motor80 is a DC motor.

In the semiconductor device A20, a DC power for driving the motor 80 isinputted to the first power supply terminal section 171B, the secondpower supply terminal section 171C, and the third power supply terminalsection 172B. The current of the DC power inputted to the first powersupply terminal section 171B, the second power supply terminal section171C, and the third power supply terminal section 172B sequentiallyflows through the plurality of first switching elements 31, theplurality of first wires 41, the plurality of second switching elements32, and the plurality of second wires 42, and is outputted from thesecond terminal section 123.

The plurality of capacitors C include a first capacitor C1 and a secondcapacitor C2. The first capacitor C1 is electrically connected to bothof the first boot terminal section 152A and the first output terminalsection 173B. The first capacitor C1 acts as the gate power supply thatgenerates the gate voltage for driving the first element 310A. Thesecond capacitor C2 is electrically connected to both of the second bootterminal section 152B and the second output terminal section 174B. Thesecond capacitor C2 acts as the gate power supply that generates thegate voltage for driving the second element 310B.

When the first element 310A and the fourth element 320B are turned on,and the second element 310B and the third element 320A are turned off,with the gate voltage outputted from the IC 20, the current runs fromthe first output terminal section 173B toward the second output terminalsection 174B. Accordingly, the motor 80 is caused to rotate (forwardrotation). At this point, the positive potential of the power supply fordriving the IC 20 is applied to the second boot terminal section 152Bvia the boot wire 45, so that the second capacitor C2 is charged.

When the second element 310B and the third element 320A are turned on,and the first element 310A and the fourth element 320B are turned off,with the gate voltage outputted from the IC 20, the current runs fromthe second output terminal section 174B toward the first output terminalsection 173B. Accordingly, the motor 80 is caused to rotate in theopposite direction (reverse rotation) to the rotation realized when thefirst element 310A and the fourth element 320B were on. At this point,the positive potential of the power supply for driving the IC 20 isapplied to the first boot terminal section 152A via the boot wire 45, sothat the first capacitor C1 is charged.

When the first element 310A and the second element 310B are turned off,and the third element 320A and the fourth element 320B are turned on,with the gate voltage outputted from the IC 20, while the motor 80 isrotating, a counter-electromotive force is generated between the firstoutput terminal section 173B and the second output terminal section174B. This force acts as a brake against the rotation of the motor 80,and therefore the motor 80 can be stopped in a shorter time.

When the first element 310A, the second element 310B, the third element320A, and the fourth element 320B are all off, the motor 80 does notrotate.

The semiconductor device A20 provides the following advantageouseffects.

The semiconductor device A20 includes the first lead 11 having themounting base 111, and the second lead 12 including the first belt-likesection 121 and the second belt-like section 122. In FIG. 17, the firstbelt-like section 121 is located on the right of the mounting base 111in the first direction x, and extends in the first direction x. Thesecond belt-like section 122 extends to the left in the first directionx, from the end of the first belt-like section 121 in the seconddirection y. The mounting base 111 overlaps with the first belt-likesection 121, when viewed in the first direction x. At least a part ofthe mounting base 111 is located adjacent to the second belt-likesection 122, in the second direction y. Accordingly, one of theplurality of arm leads 17 can be located adjacent to the secondbelt-like section 122, in the second direction y. The mentionedconfiguration enables reduction in outer size of the semiconductordevice A20 in the second direction y, while keeping the outer size ofthe semiconductor device A20 in the first direction x at a predeterminedvalue. In other words, the semiconductor device can be formed in areduced size.

The present disclosure is not limited to the foregoing embodiments. Thespecific configuration of the elements of the semiconductor deviceaccording to the present disclosure may be modified in various manners.

The present disclosure includes configurations according to thefollowing appendix.

Appendix 1. A semiconductor device comprising:

a first lead having a mounting base;

an IC configured to be mounted on the mounting base;

a second lead including a first belt-like section spaced apart from themounting base in a first direction, and a second belt-like sectionconnected to the first belt-like section, the first belt-like sectionbeing elongate in a second direction orthogonal to both of the firstdirection and a thickness direction of the mounting base, and the secondbelt-like section extending in the first direction, from an end of thefirst belt-like section toward a part of the first lead;

a plurality of arm leads arranged to locate opposite to the first leadin the first direction with respect to the second lead;

a plurality of switching elements configured to electrically connect tothe arm leads, respectively, each switching element being electricallyconnected to the IC; and

a sealing resin arranged to cover a part of each of the arm leads, thefirst lead and the second lead and further arranged to cover the IC andthe plurality of switching elements,

wherein the mounting base overlaps with the first belt-like section whenviewed in the first direction, and at least a part of the mounting baseis located adjacent to the second belt-like section in the seconddirection.

The invention claimed is:
 1. A semiconductor device comprising: a first lead including a mounting base elongate in a first direction; an IC configured to be mounted on the mounting base; a second lead including a first belt-like section spaced apart from the mounting base in the first direction, and a pair of second belt-like sections connected to the first belt-like section, the first belt-like section being elongate in a second direction orthogonal to both of the first direction and a thickness direction of the mounting base; a third lead configured to space apart from the first lead, with the second lead interposed therebetween; a plurality of first switching elements configured to electrically connect to the third lead, and configured to electrically connect to the IC; a plurality of fourth leads configured to space apart from the second lead, with the third lead interposed therebetween, and configured to electrically connect respectively to the plurality of first switching elements; a plurality of second switching elements configured to electrically connect respectively to the plurality of fourth leads, and each configured to electrically connect to both of the IC and the second lead; and a sealing resin arranged to cover a part of each of the fourth leads, the first lead, the second lead and the third lead, and to cover the IC, the plurality of first switching elements and the plurality of second switching elements, wherein the mounting base overlaps with the first belt-like section when viewed in the first direction, and at least a part of the mounting base is located between the pair of second belt-like sections.
 2. The semiconductor device according to claim 1, wherein the first lead includes a first terminal section, a first joint section, and a first suspension section, the first terminal section protrudes from the sealing resin in the first direction when viewed in the thickness direction, the first joint section connects the mounting base and the first terminal section to each other, and the first suspension section is located opposite to the first joint section in the second direction with respect to the mounting base, the first suspension section extending from the mounting base in the second direction.
 3. The semiconductor device according to claim 2, wherein the first joint section and the first suspension section are located on a farther side from the first belt-like section of the second lead with respect to the pair of second belt-like sections.
 4. The semiconductor device according to claim 3, wherein the first joint section includes a region inclined with respect to both of the first direction and the second direction.
 5. The semiconductor device according to claim 3, wherein the second lead includes a second terminal section protruding from the sealing resin in the first direction when viewed in the thickness direction, a second joint section connected to one of the pair of second belt-like sections and the second terminal section, and a second suspension section extending from the other of the pair of second belt-like sections in the second direction.
 6. The semiconductor device according to claim 5, wherein the second joint section is located adjacent to the first joint section in the second direction, and the second suspension section is located adjacent to the first suspension section in the first direction.
 7. The semiconductor device according to claim 6, wherein the second terminal section is located adjacent to the first terminal section in the second direction.
 8. The semiconductor device according to claim 7, wherein the second joint section includes a region inclined with respect to both of the first direction and the second direction.
 9. The semiconductor device according to claim 7, wherein the third lead includes a plurality of first pad sections to which the plurality of first switching elements are electrically connected respectively, a third terminal section protruding from the sealing resin in the first direction when viewed in the thickness direction, and a third joint section connected to the plurality of first pad sections and the third terminal section.
 10. The semiconductor device according to claim 9, wherein the plurality of first pad section include a first region located adjacent to the second suspension section in the first direction, a second region located adjacent to the first belt-like section in the first direction, and a third region located adjacent to the second joint section in the first direction, the third joint section includes an outer joint section connected to the first region and the third terminal section, a first inner joint section connected to the first region and the second region, and a second inner joint section connected to the second region and the third region, and the first belt-like section overlaps with the second region, the first inner joint section, and the second inner joint section, when viewed in the first direction, and a part of each of the pair of second belt-like sections is located between the first inner joint section and the second inner joint section.
 11. The semiconductor device according to claim 10, wherein the third lead includes a third suspension section extending from the third region in the second direction.
 12. The semiconductor device according to claim 11, wherein a part of the second region protrudes from both of the first inner joint section and the second inner joint section in the first direction.
 13. The semiconductor device according to claim 12, wherein the first inner joint section and the second inner joint section each include a belt-like region extending from the second region in the second direction, and the belt-like region of the first inner joint section is shorter than the belt-like region of the second inner joint section.
 14. The semiconductor device according to claim 12, wherein the plurality of fourth leads each include a second pad section to which one of the plurality of second switching elements is electrically connected, and a fourth terminal section connected to the second pad section and protruding from the sealing resin in the first direction when viewed in the thickness direction, and the plurality of fourth terminal sections are aligned in the second direction together with the third terminal section.
 15. The semiconductor device according to claim 14, wherein a part of one of the plurality of second pad sections overlaps with the first region, and is located between the outer joint section and the first inner joint section when viewed in the first direction.
 16. The semiconductor device according to claim 15, wherein the sealing resin includes a pair of side faces spaced apart from each other in the second direction, the first suspension section and the second suspension section each have an end face exposed from one of the pair of side faces, and the third suspension section has an end face exposed from the other of the pair of side faces.
 17. The semiconductor device according to claim 1, wherein the IC has a belt-like shape elongate in the first direction when viewed in the thickness direction. 